Workshop on the Use of Low Energy Ion Beams 2015

  • ORGANIZERS

    Institute of Physics , Bhubaneswar

    DATE

    07 - 09 Nov 2015

    VENUE

    Institute of Physics, Bhubaneswar

The “Workshop on the Use of Low Energy Ion Beams” is organized as a part “Celebration of 40th Year of Academic Activities of Institute of Physics, Bhubaneswar, India” during November 7 – 9, 2015 at Institute of Physics, Bhubaneswar. The main aim of this meeting is to provide a platform for scientists and research students working in the area of low energy ion beams to come together and discuss various issues of Ion Beams (energy up to 10.0 MeV). The 3-day conference will consist of keynote speakers, invited, contributed talks and poster sessions.

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Committee Members

National Advisory Committee

  • Dr. Sekhar Basu, Director, BARC
  • Prof. S. Panda, Director, IOP
  • Prof. A. K. Mohanty, Director, SINP
  • Dr. D. Kanjilal, Director, IUAC
  • Dr. G. K. Dey, BARC, Mumbai
  • Dr. A. K. Sinha, Director, UGC-DAE-CSR, Indore
  • Dr. D. K. Avasthi, IUAC
  • Prof. B. N. Dev, IACS, Kolkata
  • Dr. B. K. Panigrahi, IGCAR, Kalpakkam

National Organizing Committee

  • Prof. P. V. Satyam, IOP, Chairman
  • Prof. S. Varma, IOP
  • Prof. B. R. Sekhar, IOP
  • Prof. T. Som, IOP
  • Prof. D. Topwal, IOP
  • Prof. L. Tribedi, TIFR
  • Dr. Pranesh Sengupta, BARC
  • Dr. P. K. Sahoo, NISER
  • Dr. M. Sudarshan, UGC-DAE-CSR, Kolkata

Local Organizing Committee

  • Prof. P. V. Satyam, IOP, Chairman
  • Mr. A. K. Behera, IOP
  • Mr. R. K. Nayak, IOP (Accounts Officer)
  • Dr. S. Sarangi, IOP (Secretary)

Topics of Interest

    1. Fundamentals of ion-solid interactions

    • Modification and Damage of Materials
    • In-situ study of ion beam induced effects with TEM, XRD and Raman

    2. Applications of Ion Beam Analysis (IBA)

    • Nuclear Technology Materials
    • Surfaces and Interfaces of thin films
    • Environmental Science
    • Art and Archaeometry
    • Geophysics: Earth and Planetary Sciences
    • Biology and Medicine
    • Trace Element Analysis
    • Radiation Biology

    3. Electron Microscopy and Radiation damage study

    4. Particle Induced X-ray Emission: Micro/Macro Beam PIXE and applications

    5. Accelerator Mass Spectrometry

    6. Computer Simulations and Analysis

    7. Complementary use of IBA and other techniques of analysis

    8. New Developments in Microbeam, AMS and Ion Scattering methods

Registration (Accommodation charges not included)

1. Faculty/Scientists: ₹ 2000/= (from Educational Institutes)
2. Students, Postdoctoral fellows, etc: ₹ 1000/=
3. Company Staff: ₹ 25,000/=

Financial assistance: Some selected student who do not have any funding maybe considered for partial financial assistance
(Train fare: SL , including tatkal charges and registration fee waiver).

Registration Form

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