Abstract
In nano particle, length of the atomic column varies from centerof the grain to the edge which resulted in curved lattice planes (off zoneaxis tilting) and delocalization (can be solved using Cs correctedmicroscope). Overlap of the top atomic column with bottom of an adjacentcolumn give rise to fringe pattern having deceptive lattice spacing. Inthis talk, we will discuss the various reasons for the deceptive latticespacing in HRTEM imaging and its rectification.This technique will help usin analyzing the strain and composition of bimetallic nanoparticles withmore accuracy. In addition to this, we will discuss about the Precessionelectron Diffraction technique(PED) which is an advanced TEM technique foranalyzing the strain in bulk and thin film samples.
