Advanced Course on "Photoelectron Spectroscopy  Using X-rays"
  (Feb- May 2005)

   Last Class on :   4May     in  Lecture Hall at  9:30 am

          25 Registerd and 15 Unregistered Participants are attending the course.
       13  Participants are from Utkal University Physics Department.
         2  Participants are from  Institute of Material Science.
 

    XPS  Laboratory Schedule:

     First Lab Visit :       28Feb & 2March (System demonstration)        Group/Timing

     Second LabVisits :  20 Apr & 25 Apr     (ARXPS experiments on SiO₂/Si  and GeO/Ge) Groups/Timings

     Third LabVisits :     27 Apr &  2 May  (Data Analysis)                       Groups/Timings
 
 

  Topics Covered in the course :

 (1)  2nd Feb               Introduction to XPS and AES
 (2)  7th Feb               Basic Principles and technique of XPS and AES
 (3)  9th Feb               Vacuum Techniques, Ion Neutralisation Spectroscopy.
 (4)  28th Feb             Laboratory : Introduction to XPS system at IOP
 (5)  2nd Mar             Laboratory : Introduction to XPS system at IOP
 (6)  7th Mar              Photon sources : Theory and Working
 (7)  9th Mar              Mg, Al sources,Monochromator, Dipole selection Rules,
                                      Electron Microprobe Analysis
 (8)  14th Mar           Anlysers, RFA, CMA
 (9)  21st Mar            Parallel Plate analyser, CMA
(10) 24th Mar           CHA,  Analysers in AES &XPS, channeltron
(11)  4th April          Spectral Interpretation, nomenclature
(12)  6th April          Spectral interpretations in AES
(13) 11th April         XPS spectral interpretatons, chemical shifts
(14) 13th April         Valence band studies, Intensity variations with depth &
                                       angle, ARXPS
(15) 18th April          Quantification with XPS and AES
(16) 20th  April         Laboratory : XPS experiments on SiO₂/Si
(17) 25th  April         Laboratory : XPS experiments on GeO/Ge
(18) 27th  April         SiO₂/Si spectra, smootheing, background removal,
                                       Curve fitting, concentration of elments.
(19) 2nd  May             Analysing GeO/Ge spectra.
(20) 4th  May             Using XPS intensity for overlayer thickness, conc.,
                                       modes of growth evaluation, line shape, ARXPD.
 

 Main Books  :
 Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy   : Briggs and M.P. Seah
 An Introduction to X-Ray Spectroscopy : B.K. Agarwal (Springer Series in Optical Sciences, vol.15)
 Electron Spectroscopy: Theory, Techniques and Application:  edited By C.R. Brundle and A.D. Baker
                                               (Academic Press.)
  Building Scientific Apparatus: A practical guide to Design and Construction: by J.H. Moore,
                                                              C.C. Davis, M.A. Coplan
 Photoelectron Spectroscopy : Stefan Hufner (Springer Series in Solid State Sciences, vol.82)
 Core Level Spectroscopy in Condensed  Syatems:  edited by J. Kanamori and A. Kotani
                                                                                     (Springer Series in Solid State Sciences, vol.81)
   X-ray Spectroscopy: edited by L. V. Azaroff (McGraw Hill Book Company)
  Modern Techniques of Surface Science: D.P. Woodruff and T.A. Delchar (Cambridge Solid State Science Series)
  Electronic Properties of Surfaces : M. Prutton
  Practcal Guide to Surface Science and Spectroscopy : Y.W. Chung  (Academic Press)
 Experimental Innovations in Surface Science -A Guide to Practical Laboratory Methods and Instruments:
                                                                                        John T. Yates, Jr.    (AIP Press)
  Solid state Physics : N.W. Ashcroft and N.D. Mermin
  Physics at Surfaces: A. Zangwill (Cambridge University Press)